怎么解(jie)決高(gao)(gao)(gao)低(di)溫(wen)試(shi)(shi)驗(yan)箱(xiang)(xiang)不升(sheng)溫(wen)高(gao)(gao)(gao)低(di)溫(wen)實驗(yan)箱(xiang)(xiang)主要是(shi)(shi)(shi)通過(guo)鎳(nie)鉻(ge)合金電(dian)(dian)(dian)(dian)加熱(re)產生高(gao)(gao)(gao)溫(wen)，如(ru)(ru)(ru)果試(shi)(shi)驗(yan)箱(xiang)(xiang)不升(sheng)溫(wen)時(shi)，應先將(jiang)(jiang)機(ji)器(qi)(qi)總(zong)電(dian)(dian)(dian)(dian)源關掉，檢查(cha)(cha)(cha)加熱(re)斷路器(qi)(qi)是(shi)(shi)(shi)否(fou)有(you)(you)(you)(you)(you)跳閘，如(ru)(ru)(ru)果有(you)(you)(you)(you)(you)則合上(shang)(shang)，如(ru)(ru)(ru)沒(mei)有(you)(you)(you)(you)(you)，則繼續往(wang)(wang)下查(cha)(cha)(cha)，首(shou)先用萬用表的(de)電(dian)(dian)(dian)(dian)阻檔，測(ce)(ce)量(liang)固態(tai)(tai)繼電(dian)(dian)(dian)(dian)器(qi)(qi)的(de)輸出(chu)(chu)端到N線之(zhi)間是(shi)(shi)(shi)否(fou)有(you)(you)(you)(you)(you)約(yue)20歐(ou)的(de)電(dian)(dian)(dian)(dian)阻，如(ru)(ru)(ru)果沒(mei)有(you)(you)(you)(you)(you)，則說明(ming)加熱(re)絲(si)(si)開路了，重(zhong)點(dian)檢查(cha)(cha)(cha)加熱(re)絲(si)(si)是(shi)(shi)(shi)否(fou)損(sun)(sun)壞;如(ru)(ru)(ru)果加熱(re)絲(si)(si)沒(mei)有(you)(you)(you)(you)(you)損(sun)(sun)壞，則打開配電(dian)(dian)(dian)(dian)箱(xiang)(xiang)側蓋將(jiang)(jiang)機(ji)器(qi)(qi)運(yun)轉并處于升(sheng)溫(wen)狀態(tai)(tai)，觀察(cha)固態(tai)(tai)繼電(dian)(dian)(dian)(dian)器(qi)(qi)上(shang)(shang)的(de)導通指示燈(deng)是(shi)(shi)(shi)否(fou)點(dian)亮，如(ru)(ru)(ru)果有(you)(you)(you)(you)(you)點(dian)亮，對N線是(shi)(shi)(shi)否(fou)有(you)(you)(you)(you)(you)220V電(dian)(dian)(dian)(dian)壓，如(ru)(ru)(ru)果沒(mei)有(you)(you)(you)(you)(you)，再往(wang)(wang)上(shang)(shang)查(cha)(cha)(cha)接(jie)觸器(qi)(qi)，如(ru)(ru)(ru)果有(you)(you)(you)(you)(you)，再測(ce)(ce)量(liang)固態(tai)(tai)繼電(dian)(dian)(dian)(dian)器(qi)(qi)的(de)輸出(chu)(chu)端對N線是(shi)(shi)(shi)否(fou)有(you)(you)(you)(you)(you)220V電(dian)(dian)(dian)(dian)壓，如(ru)(ru)(ru)果沒(mei)有(you)(you)(you)(you)(you)，則說明(ming)固態(tai)(tai)繼電(dian)(dian)(dian)(dian)器(qi)(qi)內部開路損(sun)(sun)壞，須(xu)更換(huan)。其次如(ru)(ru)(ru)果固態(tai)(tai)繼電(dian)(dian)(dian)(dian)器(qi)(qi)上(shang)(shang)的(de)導通指示燈(deng)沒(mei)有(you)(you)(you)(you)(you)亮，則用萬表的(de)直流電(dian)(dian)(dian)(dian)壓檔，測(ce)(ce)量(liang)輸入端是(shi)(shi)(shi)否(fou)有(you)(you)(you)(you)(you)12V以(yi)上(shang)(shang)的(de)信號電(dian)(dian)(dian)(dian)壓，如(ru)(ru)(ru)果沒(mei)有(you)(you)(you)(you)(you)，有(you)(you)(you)(you)(you)可能為(wei)控制器(qi)(qi)沒(mei)有(you)(you)(you)(you)(you)輸出(chu)(chu)，或者損(sun)(sun)壞。然后(hou)后(hou)再檢查(cha)(cha)(cha)加熱(re)器(qi)(qi)是(shi)(shi)(shi)否(fou)損(sun)(sun)壞，把高(gao)(gao)(gao)低(di)溫(wen)實驗(yan)箱(xiang)(xiang)箱(xiang)(xiang)體(ti)內部的(de)封(feng)板拆除(chu)，用儀(yi)表測(ce)(ce)量(liang)加熱(re)絲(si)(si)兩端看是(shi)(shi)(shi)否(fou)導通，導通則是(shi)(shi)(shi)好的(de)，反之(zhi)證明(ming)已損(sun)(sun)壞，更換(huan)即可。上(shang)(shang)海柏毅(yi)|汽車電(dian)(dian)(dian)(dian)子(zi)產品(pin)的(de)環境可靠(kao)性測(ce)(ce)試(shi)(shi)。江蘇快速溫(wen)變試(shi)(shi)驗(yan)箱(xiang)(xiang)供(gong)應商

造成高(gao)(gao)低(di)(di)(di)(di)溫(wen)試(shi)(shi)驗箱(xiang)(xiang)(xiang)溫(wen)度(du)(du)不(bu)均(jun)(jun)(jun)勻(yun)(yun)的(de)(de)(de)原(yuan)因高(gao)(gao)低(di)(di)(di)(di)溫(wen)箱(xiang)(xiang)(xiang)在(zai)進行環(huan)境(jing)測(ce)(ce)試(shi)(shi)時，若溫(wen)度(du)(du)均(jun)(jun)(jun)勻(yun)(yun)度(du)(du)超出(chu)允許的(de)(de)(de)偏(pian)差(cha)(cha)范(fan)圍，則(ze)測(ce)(ce)試(shi)(shi)所得的(de)(de)(de)數(shu)據(ju)(ju)是不(bu)可(ke)靠(kao)的(de)(de)(de)，則(ze)試(shi)(shi)驗數(shu)據(ju)(ju)無法(fa)作為(wei)材料或產品的(de)(de)(de)耐高(gao)(gao)溫(wen)。是什么(me)原(yuan)因使溫(wen)度(du)(du)均(jun)(jun)(jun)勻(yun)(yun)度(du)(du)超出(chu)允許的(de)(de)(de)偏(pian)差(cha)(cha)范(fan)圍？1.高(gao)(gao)低(di)(di)(di)(di)溫(wen)試(shi)(shi)驗箱(xiang)(xiang)(xiang)工(gong)(gong)作室中測(ce)(ce)試(shi)(shi)對(dui)(dui)(dui)象的(de)(de)(de)差(cha)(cha)異：如(ru)果高(gao)(gao)低(di)(di)(di)(di)溫(wen)試(shi)(shi)驗箱(xiang)(xiang)(xiang)放置(zhi)(zhi)的(de)(de)(de)測(ce)(ce)試(shi)(shi)樣品足以(yi)影(ying)響到室內(nei)(nei)(nei)整(zheng)體(ti)熱(re)(re)對(dui)(dui)(dui)流(liu)的(de)(de)(de)話，那么(me)就會(hui)(hui)(hui)對(dui)(dui)(dui)內(nei)(nei)(nei)部溫(wen)度(du)(du)的(de)(de)(de)均(jun)(jun)(jun)勻(yun)(yun)性產生一(yi)定的(de)(de)(de)影(ying)響，即溫(wen)度(du)(du)均(jun)(jun)(jun)勻(yun)(yun)度(du)(du)。2.由于(yu)設計上的(de)(de)(de)問題，使高(gao)(gao)低(di)(di)(di)(di)溫(wen)箱(xiang)(xiang)(xiang)內(nei)(nei)(nei)部結(jie)構(gou)，空(kong)間設計難以(yi)達到均(jun)(jun)(jun)勻(yun)(yun)對(dui)(dui)(dui)稱結(jie)構(gou)，不(bu)對(dui)(dui)(dui)稱結(jie)構(gou)又必然(ran)導致內(nei)(nei)(nei)部溫(wen)度(du)(du)均(jun)(jun)(jun)勻(yun)(yun)性發生偏(pian)差(cha)(cha)。這一(yi)層次(ci)主要體(ti)現(xian)在(zai)板材設計和鈑金加(jia)工(gong)(gong)上，例如(ru)，風道設計，加(jia)熱(re)(re)管安裝位置(zhi)(zhi)，風扇(shan)功率大(da)小。這類均(jun)(jun)(jun)會(hui)(hui)(hui)影(ying)響箱(xiang)(xiang)(xiang)內(nei)(nei)(nei)溫(wen)度(du)(du)的(de)(de)(de)均(jun)(jun)(jun)勻(yun)(yun)性。4.由于(yu)工(gong)(gong)作室箱(xiang)(xiang)(xiang)壁(bi)前后左右6個面的(de)(de)(de)傳熱(re)(re)系數(shu)不(bu)同，有(you)些穿線(xian)孔(kong)。檢測(ce)(ce)孔(kong)。試(shi)(shi)驗孔(kong)等造成局(ju)部散熱(re)(re)。傳熱(re)(re)時，箱(xiang)(xiang)(xiang)體(ti)內(nei)(nei)(nei)溫(wen)度(du)(du)不(bu)均(jun)(jun)(jun)勻(yun)(yun)，從(cong)而使箱(xiang)(xiang)(xiang)壁(bi)幅射(she)對(dui)(dui)(dui)流(liu)傳熱(re)(re)不(bu)均(jun)(jun)(jun)，影(ying)響溫(wen)度(du)(du)均(jun)(jun)(jun)勻(yun)(yun)。5.箱(xiang)(xiang)(xiang)體(ti)和門(men)的(de)(de)(de)密(mi)封不(bu)嚴，如(ru)：密(mi)封條有(you)異型接縫、門(men)漏等，從(cong)而影(ying)響工(gong)(gong)作空(kong)間的(de)(de)(de)溫(wen)度(du)(du)均(jun)(jun)(jun)勻(yun)(yun)。6.如(ru)果被測(ce)(ce)物體(ti)體(ti)積太大(da)，或者測(ce)(ce)試(shi)(shi)物體(ti)放在(zai)高(gao)(gao)低(di)(di)(di)(di)溫(wen)試(shi)(shi)驗箱(xiang)(xiang)(xiang)工(gong)(gong)作室內(nei)(nei)(nei)的(de)(de)(de)位置(zhi)(zhi)或方法(fa)不(bu)當，會(hui)(hui)(hui)導致內(nei)(nei)(nei)部空(kong)氣(qi)對(dui)(dui)(dui)流(liu)受阻，從(cong)而導致溫(wen)度(du)(du)均(jun)(jun)(jun)勻(yun)(yun)度(du)(du)發生較大(da)偏(pian)差(cha)(cha)。像把測(ce)(ce)試(shi)(shi)產品放置(zhi)(zhi)在(zai)風道旁，它會(hui)(hui)(hui)嚴重影(ying)響風的(de)(de)(de)循環(huan)。廣(guang)東低(di)(di)(di)(di)溫(wen)濕熱(re)(re)試(shi)(shi)驗箱(xiang)(xiang)(xiang)廠家鹽霧(wu)試(shi)(shi)驗箱(xiang)(xiang)(xiang)不(bu)噴(pen)霧(wu)的(de)(de)(de)原(yuan)因及解決(jue)方法(fa)！

高壓蒸煮老(lao)化(hua)試驗機(PCT試驗箱）對半導體的(de)PCT測(ce)試：PCT主(zhu)要(yao)是測(ce)試半導體封(feng)裝之抗濕氣(qi)能力，待(dai)測(ce)品(pin)被放(fang)置嚴苛的(de)溫濕度(du)以(yi)及壓力環境下測(ce)試，如果半導體封(feng)裝的(de)不好，濕氣(qi)會沿者膠體或膠體與(yu)導線(xian)架之接口滲入封(feng)裝體之中，常見的(de)故(gu)裝原因(yin)：爆(bao)米花(hua)效應(ying)、動(dong)金屬化(hua)區(qu)域腐(fu)蝕造(zao)成(cheng)(cheng)之斷(duan)路、封(feng)裝體引腳間因(yin)污染造(zao)成(cheng)(cheng)之短路等相關問題。廣泛(fan)應(ying)用(yong)于線(xian)路板,多(duo)層線(xian)路板,IC,LCD,磁鐵等產(chan)品(pin)之密(mi)封(feng)性(xing)(xing)能的(de)檢測(ce),測(ce)試其(qi)制品(pin)的(de)耐(nai)壓性(xing)(xing),氣(qi)密(mi)性(xing)(xing)。加(jia)速(su)老(lao)化(hua)壽命(ming)(ming)試驗的(de)目的(de)是提高環境應(ying)力(如：溫度(du))與(yu)工(gong)作應(ying)力(施加(jia)給產(chan)品(pin)的(de)電(dian)壓、負荷等)，加(jia)快試驗過程，縮短產(chan)品(pin)或系統的(de)壽命(ming)(ming)試驗時間。

上(shang)海柏毅(yi)(yi)試(shi)驗(yan)(yan)設(she)備(bei)有限公司(si)的(de)(de)(de)高低溫(wen)(wen)(wen)(wen)(wen)試(shi)驗(yan)(yan)箱(xiang)(xiang)由于(yu)其(qi)(qi)模(mo)擬(ni)人工環(huan)境的(de)(de)(de)高溫(wen)(wen)(wen)(wen)(wen)、高濕自然條(tiao)件(jian)下(xia)的(de)(de)(de)環(huan)境，高低溫(wen)(wen)(wen)(wen)(wen)濕熱(re)試(shi)驗(yan)(yan)箱(xiang)(xiang)是(shi)航空、汽車、家電(dian)(dian)、科(ke)研等(deng)領域的(de)(de)(de)測(ce)試(shi)設(she)備(bei)，用(yong)于(yu)測(ce)試(shi)和確(que)定(ding)電(dian)(dian)工、電(dian)(dian)子(zi)及其(qi)(qi)他產品(pin)(pin)及材料(liao)(liao)進行高低溫(wen)(wen)(wen)(wen)(wen)、或恒定(ding)濕熱(re)試(shi)驗(yan)(yan)的(de)(de)(de)溫(wen)(wen)(wen)(wen)(wen)度(du)環(huan)境變(bian)化(hua)后的(de)(de)(de)參數及性能.適用(yong)于(yu)學校，工廠(chang)，研位，等(deng)單位；在(zai)實際生產當中得到(dao)運用(yong)。實際生產如果對材料(liao)(liao)或者(zhe)產品(pin)(pin)進行相關檢測(ce)或者(zhe)是(shi)腐蝕性試(shi)驗(yan)(yan)，在(zai)人工的(de)(de)(de)條(tiao)件(jian)下(xia)，較其(qi)(qi)碼要等(deng)一年到(dao)三年上(shang)甚(shen)至更長。高溫(wen)(wen)(wen)(wen)(wen)箱(xiang)(xiang)又(you)叫高溫(wen)(wen)(wen)(wen)(wen)老(lao)(lao)化(hua)試(shi)驗(yan)(yan)箱(xiang)(xiang)，高溫(wen)(wen)(wen)(wen)(wen)烤箱(xiang)(xiang)，高溫(wen)(wen)(wen)(wen)(wen)箱(xiang)(xiang)用(yong)于(yu)各類(lei)電(dian)(dian)子(zi)產品(pin)(pin)及橡膠(jiao)塑料(liao)(liao)等(deng)產品(pin)(pin)的(de)(de)(de)熱(re)老(lao)(lao)化(hua)試(shi)驗(yan)(yan)檢測(ce)。而高低溫(wen)(wen)(wen)(wen)(wen)試(shi)驗(yan)(yan)箱(xiang)(xiang)的(de)(de)(de)出現(xian)較大加快了人們檢測(ce)相關產品(pin)(pin)性能的(de)(de)(de)時間，而高溫(wen)(wen)(wen)(wen)(wen)箱(xiang)(xiang)類(lei)似(si)于(yu)烤箱(xiang)(xiang)性質，在(zai)高溫(wen)(wen)(wen)(wen)(wen)箱(xiang)(xiang)把溫(wen)(wen)(wen)(wen)(wen)度(du)加到(dao)超過常(chang)溫(wen)(wen)(wen)(wen)(wen)以上(shang)。上(shang)海柏毅(yi)(yi)試(shi)驗(yan)(yan)設(she)備(bei)提(ti)供各類(lei)軟包電(dian)(dian)芯測(ce)試(shi)用(yong)設(she)備(bei)，有高低溫(wen)(wen)(wen)(wen)(wen)濕熱(re)交(jiao)變(bian)、恒溫(wen)(wen)(wen)(wen)(wen)箱(xiang)(xiang)、雙層高低溫(wen)(wen)(wen)(wen)(wen)濕熱(re)交(jiao)變(bian)等(deng)。

高低溫試驗(yan)(yan)(yan)(yan)箱做實驗(yan)(yan)(yan)(yan)能否裝滿(man)樣品(pin)？首先答案是不可以的(de)(de)。被(bei)測(ce)樣品(pin)放入箱體(ti)后，通道會變窄，從(cong)而導致氣流速(su)(su)度增加(jia)(jia)，加(jia)(jia)速(su)(su)氣流與(yu)(yu)被(bei)測(ce)產(chan)(chan)品(pin)之間(jian)的(de)(de)熱(re)交換(huan)。這與(yu)(yu)環(huan)境(jing)條件(jian)的(de)(de)再現不符，因為在有關標準中對涉及(ji)溫度環(huan)境(jing)試驗(yan)(yan)(yan)(yan)都規(gui)定(ding)試驗(yan)(yan)(yan)(yan)箱內試驗(yan)(yan)(yan)(yan)樣件(jian)周(zhou)圍的(de)(de)空氣流速(su)(su)不應超過1.7m/s，以防止試驗(yan)(yan)(yan)(yan)樣件(jian)和周(zhou)圍氣氛產(chan)(chan)生不符合實際的(de)(de)熱(re)傳導，在空載(zai)時(shi)試驗(yan)(yan)(yan)(yan)箱內平均風(feng)(feng)速(su)(su)為0.6～0.8m/s，不超過1m/s，滿(man)足以上(shang)要(yao)求(qiu)所(suo)規(gui)定(ding)的(de)(de)空間(jian)及(ji)面積(ji)比時(shi)，流場的(de)(de)風(feng)(feng)速(su)(su)可能增大（50～100）%，平均比較(jiao)高風(feng)(feng)速(su)(su)不超過1.7m/s，滿(man)足標準規(gui)定(ding)的(de)(de)要(yao)求(qiu)。如(ru)果(guo)在試驗(yan)(yan)(yan)(yan)中不加(jia)(jia)限(xian)制地加(jia)(jia)大被(bei)測(ce)試產(chan)(chan)品(pin)的(de)(de)體(ti)積(ji)或迎風(feng)(feng)斷(duan)面積(ji)上(shang)海柏(bo)毅|明(ming)白氙燈(deng)老化試驗(yan)(yan)(yan)(yan)箱風(feng)(feng)冷(leng)與(yu)(yu)水冷(leng)的(de)(de)區別。氙燈(deng)試驗(yan)(yan)(yan)(yan)箱操作

高低溫(wen)試(shi)驗(yan)箱設定濕度達(da)不到怎么辦？江蘇快速溫(wen)變試(shi)驗(yan)箱供(gong)應商(shang)

上海柏毅的(de)(de)防塵(chen)(chen)(chen)(chen)試(shi)(shi)驗(yan)(yan)箱可用(yong)于各類汽車零部(bu)件(jian)的(de)(de)測(ce)試(shi)(shi)，檢驗(yan)(yan)其密封性及防塵(chen)(chen)(chen)(chen)效果等(deng)。那么(me)防塵(chen)(chen)(chen)(chen)試(shi)(shi)驗(yan)(yan)箱在使(shi)用(yong)過程中有哪些注(zhu)意(yi)事項呢？當內(nei)(nei)(nei)部(bu)防塵(chen)(chen)(chen)(chen)試(shi)(shi)驗(yan)(yan)箱出(chu)現(xian)故障時(shi)，立(li)刻停止(zhi)加熱，并故障提示(shi)，以提示(shi)內(nei)(nei)(nei)部(bu)出(chu)現(xian)故障；試(shi)(shi)驗(yan)(yan)完(wan)畢后，先關(guan)掉(diao)運轉(zhuan)開關(guan)，再關(guan)掉(diao)總(zong)開關(guan)，開門(men)取(qu)樣(yang)(yang)時(shi)注(zhu)意(yi)砂塵(chen)(chen)(chen)(chen)沖出(chu)；防塵(chen)(chen)(chen)(chen)試(shi)(shi)驗(yan)(yan)箱內(nei)(nei)(nei)空(kong)氣溫(wen)度應足(zu)夠(gou)高，能夠(gou)確保箱內(nei)(nei)(nei)的(de)(de)相(xiang)(xiang)對(dui)濕度達(da)到25%或更低(di)。將處于室溫(wen)下(xia)的(de)(de)樣(yang)(yang)品在不(bu)包裝，不(bu)通電，準備(bei)使(shi)用(yong)狀態下(xia)，按(an)照正常使(shi)用(yong)位置或都根據(ju)相(xiang)(xiang)關(guan)規(gui)定(ding)(ding)放入試(shi)(shi)驗(yan)(yan)箱。如果包含多個樣(yang)(yang)品，應注(zhu)意(yi)樣(yang)(yang)品之間不(bu)要接觸(chu)，不(bu)要互相(xiang)(xiang)遮擋塵(chen)(chen)(chen)(chen)；在試(shi)(shi)驗(yan)(yan)箱中注(zhu)入砂塵(chen)(chen)(chen)(chen)確保在規(gui)定(ding)(ding)的(de)(de)注(zhu)入時(shi)間內(nei)(nei)(nei)或者整(zheng)個試(shi)(shi)驗(yan)(yan)期間維(wei)持規(gui)定(ding)(ding)的(de)(de)塵(chen)(chen)(chen)(chen)濃度江蘇快速溫(wen)變試(shi)(shi)驗(yan)(yan)箱供應商(shang)

上海柏(bo)毅試(shi)驗(yan)(yan)(yan)(yan)(yan)設備有限(xian)公司依(yi)托(tuo)可靠(kao)的品質，旗下品牌上海柏(bo)毅以高質量(liang)的服務(wu)(wu)獲得廣(guang)大受眾的青睞(lai)。上海柏(bo)毅經(jing)營業(ye)(ye)績遍布國(guo)內諸多地(di)(di)區地(di)(di)區，業(ye)(ye)務(wu)(wu)布局涵蓋可程式(shi)恒(heng)溫(wen)恒(heng)濕試(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)，小型高低(di)溫(wen)試(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)，冷熱沖擊(ji)試(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)，快速溫(wen)變試(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)箱(xiang)等板(ban)塊(kuai)。隨(sui)著我們的業(ye)(ye)務(wu)(wu)不斷(duan)擴展，從可程式(shi)恒(heng)溫(wen)恒(heng)濕試(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)，小型高低(di)溫(wen)試(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)，冷熱沖擊(ji)試(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)，快速溫(wen)變試(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)箱(xiang)等到眾多其他(ta)領(ling)域，已經(jing)逐步成(cheng)長為一個獨特，且具有活力與創新(xin)的企業(ye)(ye)。公司坐落于安亭鎮楊(yang)木橋支(zhi)路8號(hao)6幢A區，業(ye)(ye)務(wu)(wu)覆蓋于全國(guo)多個省市和地(di)(di)區。持續多年業(ye)(ye)務(wu)(wu)創收，進一步為當地(di)(di)經(jing)濟、社會協調發展做(zuo)出(chu)了(le)貢獻(xian)。

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